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3rd announcement - call for abstracts (full version)

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Symposium 2

Advanced Characterization, Testing, and Analysis of Materials

The symposium will cover recent development in structure and composition analysis, as well as testing and analysis of mechanical, physical and chemical properties of ceramics and composites. The advanced characterization methods include, but are not limited to, (synchrotron) X-ray, neutron and electron diffraction, electron microscopy and spectroscopy, X-ray/neutron total scattering, vibrational spectroscopy (IR/Raman), NMR, optical imaging and spectroscopy, and related tools. New insights from in-situ or in-operando studies are of interest, as well as integration of first-principles calculations and complex data modeling methods. These techniques enable one to study not only static and long-range periodic structures, but also dynamic and short-and/or intermediate-range structures that substantially influence the mechanical and function properties of ceramics. Multi-scale characterizations from the atomic to nanoscale dimensions are of interest as they are becoming more important in understanding the synthesis and performance of ceramic and composites. This symposium thus aims to provide a cross-technique forum on the characterization of ceramics with emphases on correlations between structural elements, including defects, domains, dislocation, grain boundary, surface and interface, with mechanical, functional properties and sintering, energy storage/conversion behaviors to communicate the latest results and exchange perspectives. 

Proposed sessions

ª Structure analysis by X-ray, neutron, synchrotron and electron diffraction such as X-ray microscopy,

   tomography and ptychography based on Bragg diffraction, transmission and fluorescence contrast

ª Structure and composition analysis by scanning electron microscopy, transmission electron microscopy,

   focused ion beam microscopy, electron probe microscopy

ª Scanning probe microscopy/near-field optical microscopy characterizations of nanoscale electric,

   piezoelectric, magnetic, thermal and optical properties

ª In-situ time-resolved analysis and ultrafast electron diffraction/microscopy  

ª Spectral analysis including XPS, X-ray (XAFS), NMR, EPR, and vibrational spectroscopy (IR/Raman)

ª Testing and analysis methods for mechanical and physical and chemical properties of materials

ª Data modeling, global optimizations, statistical treatment of data


- Scott T. Misture (Points of Contact), Alfred University, USA, misture@alfred.edu

- Daqing Wei (Points of Contact), Harbin Institute of Technology, China, daqingwei@hit.edu.cn

- Yunseok Kim, Sungkyunkwan University, Korea

- Jiancun Rao, University of Maryland, USA 

- Qian Li, Tsinghua University, China 

- Rongkun Zheng, University of Sydney, Australia

- Jie Zhang, Institute of Metal Research, Chinese Academy of Sciences, China

Detian Wan, China Building Materials Academy, China

- Qiang Zheng, National Center for Nanoscience and Technology, China

Yujin Tong, University of Duisburg-Essen, Germany

Chunlin Chen, Institute of Metal Research, Chinese Academy of Sciences, China

- Yu Deng, Nanjing University, China

Yanwen Zhang, Idaho National Laboratory,USA

Point of Contact Assistant

* Yongchun Zou, Harbin Institute of Technology, China, zouyongchun@hit.edu.cn

Keynote Speakers

Invited Speakers
To be confirmed